Method of synthesis of easily testable circuits admitting single fault detection tests of constant length (Q2629840): Difference between revisions
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Latest revision as of 00:42, 20 March 2024
scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Method of synthesis of easily testable circuits admitting single fault detection tests of constant length |
scientific article |
Statements
Method of synthesis of easily testable circuits admitting single fault detection tests of constant length (English)
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7 July 2016
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circuit of functional elements
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single fault detection test
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constant fault at the output of gate
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Shannon function
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length of a test
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easily testable circuit
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