Method of synthesis of easily testable circuits admitting single fault detection tests of constant length
From MaRDI portal
Publication:2629840
DOI10.1515/dma-2014-0021zbMath1339.94106OpenAlexW2320432312MaRDI QIDQ2629840
Publication date: 7 July 2016
Published in: Discrete Mathematics and Applications (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1515/dma-2014-0021
Shannon functioneasily testable circuitsingle fault detection testcircuit of functional elementsconstant fault at the output of gatelength of a test
Related Items (12)
The length of single-fault detection tests with respect to substitution of inverters for combinational elements in some bases ⋮ Estimations of the lengths of tests for logic gates in presence of many permissible faults ⋮ Complete Fault Detection Tests of Length 2 for Logic Networks under Stuck-at Faults of Gates ⋮ Short single fault detection tests for logic networks under arbitrary faults of gates ⋮ On the exact value of the length of the minimal single diagnostic test for a particular class of circuits ⋮ SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES ⋮ Lower bounds for the lengths of single tests for Boolean circuits ⋮ A method of synthesis of irredundant circuits admitting single fault detection tests of constant length ⋮ Short single tests for circuits with arbitrary stuck-at faults at outputs of gates ⋮ Lower bound of the length of a single fault diagnostic test with respect to insertions of a mod-2 adder ⋮ The length of single fault detection tests with respect to substitution of gates with inverters ⋮ Synthesis of circuits admitting complete checking tests of constant length under inverse faults at outputs of elements
This page was built for publication: Method of synthesis of easily testable circuits admitting single fault detection tests of constant length
