Lower bounds for the lengths of single tests for Boolean circuits

From MaRDI portal
Publication:1741479

DOI10.1515/dma-2019-0004zbMath1454.94145OpenAlexW2916471771WikidataQ128315100 ScholiaQ128315100MaRDI QIDQ1741479

Kirill A. Popkov

Publication date: 3 May 2019

Published in: Discrete Mathematics and Applications (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1515/dma-2019-0004




Related Items (4)




Cites Work




This page was built for publication: Lower bounds for the lengths of single tests for Boolean circuits