Lower bounds for the lengths of single tests for Boolean circuits

DOI10.1515/DMA-2019-0004MaRDI QIDQ1741479zbMATH OpenOpenAlexWikidataFDO

Authors Kirill A. Popkov

Publication date 3 May 2019

Published in Discrete Mathematics and Applications (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1515/dma-2019-0004

zbMATH Keywords

Boolean circuitsingle diagnostic testsingle fault detection teststuck-at fault

Mathematics Subject Classification ID

Analytic circuit theory (94C05) Fault detection; testing in circuits and networks (94C12)

Recommendations

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• On the length of diagnostic tests for Boolean circuits

Cites work

• Circuits admitting single-fault tests of length 1 under constant faults at outputs of elements
• Easily Testable Realizations ror Logic Functions
• scientific article; zbMATH DE number 4172919 (Why is no real title available?)
• scientific article; zbMATH DE number 3150822 (Why is no real title available?)
• scientific article; zbMATH DE number 4139472 (Why is no real title available?)
• scientific article; zbMATH DE number 3963735 (Why is no real title available?)
• scientific article; zbMATH DE number 4085569 (Why is no real title available?)
• Lower bounds for lengths of complete diagnostic tests for circuits and inputs of circuits
• Method of synthesis of easily testable circuits admitting single fault detection tests of constant length
• On the exact value of the length of the minimal single diagnostic test for a particular class of circuits
• On the synthesis of circuits admitting complete fault detection test sets of constant length under arbitrary constant faults at the outputs of the gates
• On unit diagnostic tests for constant faults of the same type at outputs of functional elements
• Reliability and diagnostics of circuits
• Synthesis of easily testable circuits over the Zhegalkin basis in the case of constant faults of type 0 at outputs of elements
• Synthesis of easily-tested circuits in the case of single-type constant malfunctions at the element outputs

Cited in

(13)

• A bound on information cost of circuit diagnosing tests
• Lower bound of the length of a single fault diagnostic test with respect to insertions of a mod-2 adder
• The length of single fault detection tests with respect to substitution of gates with inverters
• The length of single-fault detection tests with respect to substitution of inverters for combinational elements in some bases
• Short single tests for circuits with arbitrary stuck-at faults at outputs of gates
• Lower Bounds for Testing Computability by Small Width OBDDs
• On the number of minimal tests checking the block circuits of parity functions for closings
• Lower bounds for the length of test sequences using UIOs
• Lower bounds for lengths of complete diagnostic tests for circuits and inputs of circuits
• A method for constructing logic networks allowing short single diagnostic tests
• Single fault detection test sets with respect to stuck-at faults at the outputs of gates in formulas over one basis of Zhegalkin type
• Short single-fault tests for circuits in the Zhegalkin basis with arbitrary stuck-at faults of gates
• Easy-to-test circuits in the Zhegalkin basis with arbitrary stuck-at faults of gate outputs

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