scientific article; zbMATH DE number 3150822

Cited in

(38)

Lower bounds for one-way probabilistic communication complexity and their application to space complexity
On fault detection tests of contact break for contact circuits
Lower bounds for the lengths of single tests for Boolean circuits
Complete diagnostic length 2 tests for logic networks under inverse faults of logic gates
Bounds on Shannon functions of lengths of contact closure tests for contact circuits
Lower bound of the length of a single fault diagnostic test with respect to insertions of a mod-2 adder
Short tests of closures for contact circuits
Short single tests for circuits with arbitrary stuck-at faults at outputs of gates
Diagnosis of constant faults in read-once contact networks over finite bases
Synthesis of circuits admitting complete checking tests of constant length under inverse faults at outputs of elements
On algorithms for construction of all irreducible partial covers
Unit checking output tests under constant faults for functional elements
Diagnosis of constant faults in iteration-free circuits over monotone basis
Minimizing depth of decision trees with hypotheses
Diagnosis of three types of constant faults in read-once contact networks over finite bases
Estimations of the lengths of tests for logic gates in presence of many permissible faults
Tests of contact closure for contact circuits
Complete fault detection tests of length 2 for logic networks under stuck-at faults of gates
Short single fault detection tests for logic networks under arbitrary faults of gates
Combinatorial results on the complexity of teaching and learning
Lower bounds for lengths of complete diagnostic tests for circuits and inputs of circuits
SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES
On an invariant for the problem of underdetermined data decomposing
Synthesis of easily testable logic networks under arbitrary stuck-at faults at inputs and outputs of gates
A method for constructing logic networks allowing short single diagnostic tests
On the relation between rough set reducts and typical testors
On the exact value of the length of the minimal single diagnostic test for a particular class of circuits
An overview of the evolution of the concept of testor
Shannon function of the test length with respect to gate input identification
Short fault detection tests for contact circuits under arbitrary weakly connected faults of contacts
Short tests for contact circuits with similar-type weakly connected faults of contacts
Supervised classification problem: new models of logical correctors
Short single fault detection tests of contact break for contact circuits with two or more additional poles
Short fault detection tests of contact break for contact circuits with an additional pole
On diagnostic tests of contact break for contact circuits
The length of a single fault detection test for constant-nonpreserving element insertions
Single fault detection tests for generalized iterative switching circuits
Fault detection tests for stuck-at faults on parity counter inputs

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