The length of a single fault detection test for constant-nonpreserving element insertions

DOI10.1007/S10598-021-09510-5zbMATH Open1460.94094OpenAlexW3127903713MaRDI QIDQ830998FDOQ830998

Authors: N. E. Aleksandrova, Dmitry S. Romanov 

Publication date: 10 May 2021

Published in: Computational Mathematics and Modeling (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/s10598-021-09510-5

Recommendations

• Single fault detection tests for circuits of functional elements
• The length of single-fault detection tests with respect to substitution of inverters for combinational elements in some bases
• Short single tests for circuits with arbitrary stuck-at faults at outputs of gates
• A method of synthesis of irredundant circuits admitting single fault detection tests of constant length
• The length of single fault detection tests with respect to substitution of gates with inverters

zbMATH Keywords

detection testcombinational circuitsShannon function of test lengthelement insertion

Mathematics Subject Classification ID

Switching theory, applications of Boolean algebras to circuits and networks (94C11) Fault detection; testing in circuits and networks (94C12)

Cites Work

• Reliability and diagnostics of circuits
• Title not available (Why is that?)
• Complexity of Boolean functions in the class of polarized polynomial forms
• Circuits admitting single-fault tests of length 1 under constant faults at outputs of elements
• Title not available (Why is that?)
• SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES
• Title not available (Why is that?)
• Title not available (Why is that?)
• Synthesis of easily testable logic networks under arbitrary stuck-at faults at inputs and outputs of gates
• Complete fault detection tests of length 2 for logic networks under stuck-at faults of gates
• A method of synthesis of irredundant circuits admitting single fault detection tests of constant length
• Title not available (Why is that?)
• Dual-Mode Logic for Function-Independent Fault Testing
• A Note on Easily Testable Realizations for Logic Functions
• On Minimally Testable Logic Networks
• Short Complete Fault Detection Tests for Logic Networks with Fan-In Two
• Identity checking tests for circuits of functional elements in fan-in 2 bases
• Lower estimate of the length of the complete test in the basis \(\{x|y \}\)

Cited In (5)

• Title not available (Why is that?)
• Single fault detection tests for generalized iterative switching circuits
• Lower bound of the length of a single fault diagnostic test with respect to insertions of a mod-2 adder
• The length of single fault detection tests with respect to substitution of gates with inverters
• The length of single-fault detection tests with respect to substitution of inverters for combinational elements in some bases

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