The length of a single fault detection test for constant-nonpreserving element insertions

DOI10.1007/S10598-021-09510-5MaRDI QIDQ830998zbMATH OpenOpenAlexFDO

Authors N. E. Aleksandrova, Dmitry S. Romanov

Publication date 10 May 2021

Published in Computational Mathematics and Modeling (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1007/s10598-021-09510-5

zbMATH Keywords

combinational circuitsdetection testelement insertionShannon function of test length

Mathematics Subject Classification ID

Switching theory, applications of Boolean algebras to circuits and networks (94C11) Fault detection; testing in circuits and networks (94C12)

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Cites work

• A method of synthesis of irredundant circuits admitting single fault detection tests of constant length
• A Note on Easily Testable Realizations for Logic Functions
• Circuits admitting single-fault tests of length 1 under constant faults at outputs of elements
• Complete fault detection tests of length 2 for logic networks under stuck-at faults of gates
• Complexity of Boolean functions in the class of polarized polynomial forms
• Dual-Mode Logic for Function-Independent Fault Testing
• scientific article; zbMATH DE number 4172919 (Why is no real title available?)
• scientific article; zbMATH DE number 3150822 (Why is no real title available?)
• scientific article; zbMATH DE number 4074973 (Why is no real title available?)
• scientific article; zbMATH DE number 1740020 (Why is no real title available?)
• scientific article; zbMATH DE number 3110611 (Why is no real title available?)
• Identity checking tests for circuits of functional elements in fan-in 2 bases
• Lower estimate of the length of the complete test in the basis \(\{x|y \}\)
• On Minimally Testable Logic Networks
• Reliability and diagnostics of circuits
• Short Complete Fault Detection Tests for Logic Networks with Fan-In Two
• SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES
• Synthesis of easily testable logic networks under arbitrary stuck-at faults at inputs and outputs of gates

Cited in

(5)

• Lower bound of the length of a single fault diagnostic test with respect to insertions of a mod-2 adder
• The length of single fault detection tests with respect to substitution of gates with inverters
• The length of single-fault detection tests with respect to substitution of inverters for combinational elements in some bases
• scientific article; zbMATH DE number 1257247 (Why is no real title available?)
• Single fault detection tests for generalized iterative switching circuits

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