Lower estimate of the length of the complete test in the basis \x|y \
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Publication:891140
Recommendations
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Cites work
Cited in
(10)- A method of synthesis of irredundant circuits admitting single fault detection tests of constant length
- Lower bound of the length of a single fault diagnostic test with respect to insertions of a mod-2 adder
- Short single tests for circuits with arbitrary stuck-at faults at outputs of gates
- Short complete diagnostic tests for logic circuits in one infinite basis
- Complete fault detection tests of length 2 for logic networks under stuck-at faults of gates
- Short Complete Fault Detection Tests for Logic Networks with Fan-In Two
- Lower bounds for lengths of complete diagnostic tests for circuits and inputs of circuits
- SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES
- Some test length bounds for nonrepeating functions in the \(\{ \& , \vee \}\) basis
- The length of a single fault detection test for constant-nonpreserving element insertions
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