Lower estimate of the length of the complete test in the basis \(\{x|y \}\)

DOI10.3103/S0027132215040063zbMath1357.94109OpenAlexW1440785124MaRDI QIDQ891140

Yulia V. Borodina

Publication date: 16 November 2015

Published in: Moscow University Mathematics Bulletin (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.3103/s0027132215040063

Mathematics Subject Classification ID

Related Items (9)

The length of a single fault detection test for constant-nonpreserving element insertions ⋮ Complete Fault Detection Tests of Length 2 for Logic Networks under Stuck-at Faults of Gates ⋮ Short complete diagnostic tests for logic circuits in one infinite basis ⋮ LOWER BOUNDS FOR LENGTHS OF COMPLETE DIAGNOSTIC TESTS FOR CIRCUITS AND INPUTS OF CIRCUITS ⋮ SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES ⋮ A method of synthesis of irredundant circuits admitting single fault detection tests of constant length ⋮ Short Complete Fault Detection Tests for Logic Networks with Fan-In Two ⋮ Short single tests for circuits with arbitrary stuck-at faults at outputs of gates ⋮ Lower bound of the length of a single fault diagnostic test with respect to insertions of a mod-2 adder

Cites Work

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• Synthesis of easily-tested circuits in the case of single-type constant malfunctions at the element outputs

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