Lower bound of the length of a single fault diagnostic test with respect to insertions of a mod-2 adder

DOI10.1007/S10598-022-09549-YMaRDI QIDQ2096002zbMATH OpenOpenAlexFDO

Authors N. E. Aleksandrova, Dmitry S. Romanov

Publication date 16 November 2022

Published in Computational Mathematics and Modeling (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1007/s10598-022-09549-y

zbMATH Keywords

diagnostic testelement insertionlogic circuitShannon function of test length

Mathematics Subject Classification ID

Switching theory, applications of Boolean algebras to circuits and networks (94C11) Fault detection; testing in circuits and networks (94C12)

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Cites work

• A method for constructing logic networks allowing short single diagnostic tests
• A method of synthesis of irredundant circuits admitting single fault detection tests of constant length
• Circuits admitting single-fault tests of length 1 under constant faults at outputs of elements
• Dual-Mode Logic for Function-Independent Fault Testing
• scientific article; zbMATH DE number 3150822 (Why is no real title available?)
• scientific article; zbMATH DE number 3487367 (Why is no real title available?)
• scientific article; zbMATH DE number 3510201 (Why is no real title available?)
• scientific article; zbMATH DE number 1129494 (Why is no real title available?)
• Lower bounds for lengths of complete diagnostic tests for circuits and inputs of circuits
• Lower estimate of the length of the complete test in the basis \(\{x|y \}\)
• Method of synthesis of easily testable circuits admitting single fault detection tests of constant length
• On the exact value of the length of the minimal single diagnostic test for a particular class of circuits
• On the synthesis of circuits admitting complete fault detection test sets of constant length under arbitrary constant faults at the outputs of the gates
• Short Complete Fault Detection Tests for Logic Networks with Fan-In Two
• Short single tests for circuits with arbitrary stuck-at faults at outputs of gates
• SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES
• Synthesis of circuits admitting complete checking tests of constant length under inverse faults at outputs of elements
• Synthesis of easily testable circuits over the Zhegalkin basis in the case of constant faults of type 0 at outputs of elements
• Synthesis of easily-tested circuits in the case of single-type constant malfunctions at the element outputs
• The length of a single fault detection test for constant-nonpreserving element insertions

Cited in

(3)

• Lower bounds for the lengths of single tests for Boolean circuits
• A Minimum Test Set for Multiple Fault Detection in Ripple Carry Adders
• Lower estimate of the length of the complete test in the basis \(\{x|y \}\)

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