SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES
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Recommendations
- Short single fault detection tests for logic networks under arbitrary faults of gates
- On logic networks allowing short single fault detection tests under arbitrary faults of gates
- Single tests for logical gates
- Single fault detection tests for generalized iterative switching circuits
- Single fault detection tests for circuits of functional elements
- Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases
- Complete fault detection tests of length 2 for logic networks under stuck-at faults of gates
- On tests detecting certain faults of circuit inputs for almost all Boolean functions
- Short Complete Fault Detection Tests for Logic Networks with Fan-In Two
- Faults detection in combinational circuits of OR-coincidence type universal logic gates
Cites work
- Circuits admitting single-fault tests of length 1 under constant faults at outputs of elements
- Complete tests for circuits of functional elements
- Easily Testable Realizations ror Logic Functions
- scientific article; zbMATH DE number 4172919 (Why is no real title available?)
- scientific article; zbMATH DE number 3150822 (Why is no real title available?)
- scientific article; zbMATH DE number 4139472 (Why is no real title available?)
- scientific article; zbMATH DE number 4085569 (Why is no real title available?)
- Lower estimate of the length of the complete test in the basis \(\{x|y \}\)
- Method of synthesis of easily testable circuits admitting single fault detection tests of constant length
- On schemes admitting brief tests
- On the synthesis of circuits admitting complete fault detection test sets of constant length under arbitrary constant faults at the outputs of the gates
- On unit diagnostic tests for constant faults of the same type at outputs of functional elements
- Reliability and diagnostics of circuits
- Synthesis of easily testable circuits over the Zhegalkin basis in the case of constant faults of type 0 at outputs of elements
- Synthesis of easily-tested circuits in the case of single-type constant malfunctions at the element outputs
Cited in
(12)- A method of synthesis of irredundant circuits admitting single fault detection tests of constant length
- Lower bound of the length of a single fault diagnostic test with respect to insertions of a mod-2 adder
- The length of single fault detection tests with respect to substitution of gates with inverters
- On self-correcting logic circuits of unreliable gates with at most two inputs
- The length of single-fault detection tests with respect to substitution of inverters for combinational elements in some bases
- Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases
- Short single tests for circuits with arbitrary stuck-at faults at outputs of gates
- Detecting tests for Boolean functions in presence of local linear faults of the inputs of circuits
- Single fault detection tests for circuits of functional elements
- Short Complete Fault Detection Tests for Logic Networks with Fan-In Two
- Short single fault detection tests for logic networks under arbitrary faults of gates
- The length of a single fault detection test for constant-nonpreserving element insertions
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