scientific article; zbMATH DE number 4139472
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Publication:3471835
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(38)- Reliability of tolerance methods of checking of complex systems
- Transformation of automata for simplified checking
- On fault detection tests of contact break for contact circuits
- Lower bounds for the lengths of single tests for Boolean circuits
- Complete diagnostic length 2 tests for logic networks under inverse faults of logic gates
- Bounds on Shannon functions of lengths of contact closure tests for contact circuits
- Short tests of closures for contact circuits
- Minimal complete fault detection tests for circuits of functional elements in standard basis
- Short single tests for circuits with arbitrary stuck-at faults at outputs of gates
- Unit checking output tests under constant faults for functional elements
- Some classes of easily testable circuits in the Zhegalkin basis
- Short complete diagnostic tests for circuits implementing linear Boolean functions
- Reliability and diagnostics of circuits
- Estimates of the complexity of experiments with controlled blocks of permutations
- Estimations of the lengths of tests for logic gates in presence of many permissible faults
- How to Hand-Check a Symbolic Reliability Expression
- Tests of contact closure for contact circuits
- On Partial Covers, Reducts and Decision Rules
- scientific article; zbMATH DE number 1203274 (Why is no real title available?)
- Complete fault detection tests of length 2 for logic networks under stuck-at faults of gates
- Lower bounds for lengths of complete diagnostic tests for circuits and inputs of circuits
- SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES
- Synthesis of easily testable logic networks under arbitrary stuck-at faults at inputs and outputs of gates
- A method for constructing logic networks allowing short single diagnostic tests
- On the exact value of the length of the minimal single diagnostic test for a particular class of circuits
- Short complete diagnostic tests for circuits with two additional inputs in some basis
- Shannon function of the test length with respect to gate input identification
- Short fault detection tests for contact circuits under arbitrary weakly connected faults of contacts
- Short conditional complete diagnostic tests for circuits under one-type constant faults of gates
- Estimates of test lengths in the Zhegalkin basis for constant type-1 faults at gate outputs
- Short single-fault tests for circuits in the Zhegalkin basis with arbitrary stuck-at faults of gates
- Short tests for contact circuits with similar-type weakly connected faults of contacts
- Easy-to-test circuits in the Zhegalkin basis with arbitrary stuck-at faults of gate outputs
- Short single fault detection tests of contact break for contact circuits with two or more additional poles
- Short fault detection tests of contact break for contact circuits with an additional pole
- On diagnostic tests of contact break for contact circuits
- Easily testable circuits in Zhegalkin basis in the case of constant faults of type ``1 at gate outputs
- Lower estimate of the length of the complete test in the basis \(\{x|y \}\)
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