scientific article; zbMATH DE number 4139472
From MaRDI portal
Publication:3471835
zbMATH Open0695.90049MaRDI QIDQ3471835FDOQ3471835
Authors: S. V. Yablonskij 
Publication date: 1988
Title of this publication is not available (Why is that?)
Recommendations
- Efficiency, reliability, and viability of control systems
- scientific article; zbMATH DE number 1740358
- Publication:3035209
- Reliability of engineering systems with combined performance control
- Design of reliable control systems
- scientific article; zbMATH DE number 4012398
- scientific article; zbMATH DE number 3926612
- Reliability modeling of fault tolerant control systems
- Reliability of tolerance methods of checking of complex systems
- scientific article; zbMATH DE number 2032359
testingautomatafault tolerant systemserror correcting circuitsboolean functionsswitching circuitscomplexity of checking
Reliability, availability, maintenance, inspection in operations research (90B25) Applications of renewal theory (reliability, demand theory, etc.) (60K10) Research exposition (monographs, survey articles) pertaining to operations research and mathematical programming (90-02)
Cited In (30)
- Short complete diagnostic tests for circuits implementing linear Boolean functions
- Unit checking output tests under constant faults for functional elements
- Tests of contact closure for contact circuits
- Complete fault detection tests of length 2 for logic networks under stuck-at faults of gates
- Easily testable circuits in Zhegalkin basis in the case of constant faults of type ``1 at gate outputs
- Lower estimate of the length of the complete test in the basis \(\{x|y \}\)
- Estimations of the lengths of tests for logic gates in presence of many permissible faults
- Reliability of tolerance methods of checking of complex systems
- Lower bounds for the lengths of single tests for Boolean circuits
- Synthesis of easily testable logic networks under arbitrary stuck-at faults at inputs and outputs of gates
- Lower bounds for lengths of complete diagnostic tests for circuits and inputs of circuits
- On Partial Covers, Reducts and Decision Rules
- Reliability and diagnostics of circuits
- Short single tests for circuits with arbitrary stuck-at faults at outputs of gates
- Short complete diagnostic tests for circuits with two additional inputs in some basis
- Estimates of the complexity of experiments with controlled blocks of permutations
- SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES
- How to Hand-Check a Symbolic Reliability Expression
- Some classes of easily testable circuits in the Zhegalkin basis
- Shannon function of the test length with respect to gate input identification
- Bounds on Shannon functions of lengths of contact closure tests for contact circuits
- Complete diagnostic length 2 tests for logic networks under inverse faults of logic gates
- Short tests of closures for contact circuits
- Short fault detection tests for contact circuits under arbitrary weakly connected faults of contacts
- On diagnostic tests of contact break for contact circuits
- On the exact value of the length of the minimal single diagnostic test for a particular class of circuits
- A method for constructing logic networks allowing short single diagnostic tests
- Short conditional complete diagnostic tests for circuits under one-type constant faults of gates
- On fault detection tests of contact break for contact circuits
- Minimal complete fault detection tests for circuits of functional elements in standard basis
This page was built for publication:
Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q3471835)
