Short single tests for circuits with arbitrary stuck-at faults at outputs of gates

DOI10.1515/DMA-2019-0030MaRDI QIDQ2332897zbMATH OpenOpenAlexFDO

Authors Kirill A. Popkov

Publication date 5 November 2019

Published in Discrete Mathematics and Applications (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1515/dma-2019-0030

zbMATH Keywords

stuck-at faultcircuit of gatessingle diagnostic testsingle fault detection test

Mathematics Subject Classification ID

Switching theory, applications of Boolean algebras to circuits and networks (94C11) Fault detection; testing in circuits and networks (94C12) Boolean functions (94D10)

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Cites work

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• On the synthesis of circuits admitting complete fault detection test sets of constant length under arbitrary constant faults at the outputs of the gates
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• SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES
• Single fault detection tests for circuits of functional elements
• Synthesis of easily testable circuits over the Zhegalkin basis in the case of constant faults of type 0 at outputs of elements
• Synthesis of easily-tested circuits in the case of single-type constant malfunctions at the element outputs

Cited in

(23)

• Lower bound of the length of a single fault diagnostic test with respect to insertions of a mod-2 adder
• The length of single fault detection tests with respect to substitution of gates with inverters
• Single fault diagnostic tests for inversion faults of circuit elements over some bases
• Single tests for logical gates
• Easily testable circuits in Zhegalkin basis in the case of constant faults of type ``1 at gate outputs
• The length of a single fault detection test for constant-nonpreserving element insertions
• On testing output faults in the McCluskey fault model
• scientific article; zbMATH DE number 3922347 (Why is no real title available?)
• The length of single-fault detection tests with respect to substitution of inverters for combinational elements in some bases
• Efficient VLSI fault simulation
• Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases
• On the length of diagnostic tests for Boolean circuits
• Maximum ease of testability of logic circuits with respect to multiple stuck-on faults
• On self-correcting logic circuits of unreliable gates with at most two inputs
• Short single fault detection tests for logic networks under arbitrary faults of gates
• scientific article; zbMATH DE number 808802 (Why is no real title available?)
• On logic networks allowing short single fault detection tests under arbitrary faults of gates
• On self-correcting logic circuits of unreliable gates
• Short complete diagnostic tests for circuits with one additional input in the standard basis
• Lower bounds for the lengths of single tests for Boolean circuits
• On the exact value of the length of the minimal single diagnostic test for a particular class of circuits
• A method of synthesis of irredundant circuits admitting single fault detection tests of constant length
• Single fault detection tests for generalized iterative switching circuits

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