Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases

DOI10.1515/DMA-2022-0001MaRDI QIDQ2136299zbMATH OpenOpenAlexFDO

Authors Iľya G. Lyubich, Dmitry S. Romanov

Publication date 10 May 2022

Published in Discrete Mathematics and Applications (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1515/dma-2022-0001

zbMATH Keywords

Shannon functionBoolean circuiteasily testable circuitsingle diagnostic testinversion fault at gate output

Mathematics Subject Classification ID

Switching theory, applications of Boolean algebras to circuits and networks (94C11) Fault detection; testing in circuits and networks (94C12)

Recommendations

• Single fault diagnostic tests for inversion faults of circuit elements over some bases
• Short single fault detection tests for logic networks under arbitrary faults of gates
• Short complete diagnostic tests for logic circuits in one infinite basis
• On logic networks allowing short single fault detection tests under arbitrary faults of gates
• Complete diagnostic length 2 tests for logic networks under inverse faults of logic gates
• SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES
• About unitary diagnostic tests for constant faults of the same type at the outputs of functional gates
• Short single tests for circuits with arbitrary stuck-at faults at outputs of gates
• Construction of tests for finding multiple faults in combinational devices in arbitrary bases
• On tests detecting certain faults of circuit inputs for almost all Boolean functions

Cites work

• scientific article; zbMATH DE number 4172919 (Why is no real title available?)
• scientific article; zbMATH DE number 1740020 (Why is no real title available?)
• Complete diagnostic length 2 tests for logic networks under inverse faults of logic gates
• Single fault diagnostic tests for inversion faults of circuit elements over some bases
• Synthesis of circuits admitting complete checking tests of constant length under inverse faults at outputs of elements

Cited in

(7)

• The length of single fault detection tests with respect to substitution of gates with inverters
• Locating errors in faulty formulas
• Single fault diagnostic tests for inversion faults of circuit elements over some bases
• SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES
• Implementation of Linear Boolean Functions by Self-Correcting Circuits of Unreliable Logic Gates
• Shannon function of the test length with respect to gate input identification
• Short single tests for circuits with arbitrary stuck-at faults at outputs of gates

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