Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases

DOI10.1515/DMA-2022-0001zbMATH Open1492.94228OpenAlexW4213350236MaRDI QIDQ2136299FDOQ2136299

Authors: Iľya G. Lyubich, Dmitry S. Romanov 

Publication date: 10 May 2022

Published in: Discrete Mathematics and Applications (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1515/dma-2022-0001

Recommendations

• Single fault diagnostic tests for inversion faults of circuit elements over some bases
• Short single fault detection tests for logic networks under arbitrary faults of gates
• Short complete diagnostic tests for logic circuits in one infinite basis
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• Complete diagnostic length 2 tests for logic networks under inverse faults of logic gates
• SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES
• About unitary diagnostic tests for constant faults of the same type at the outputs of functional gates
• Short single tests for circuits with arbitrary stuck-at faults at outputs of gates
• Construction of tests for finding multiple faults in combinational devices in arbitrary bases
• On tests detecting certain faults of circuit inputs for almost all Boolean functions

zbMATH Keywords

Shannon functionBoolean circuiteasily testable circuitsingle diagnostic testinversion fault at gate output

Mathematics Subject Classification ID

Switching theory, applications of Boolean algebras to circuits and networks (94C11) Fault detection; testing in circuits and networks (94C12)

Cites Work

• Title not available (Why is that?)
• Single fault diagnostic tests for inversion faults of circuit elements over some bases
• Title not available (Why is that?)
• Complete diagnostic length 2 tests for logic networks under inverse faults of logic gates
• Synthesis of circuits admitting complete checking tests of constant length under inverse faults at outputs of elements

Cited In (4)

• Short single tests for circuits with arbitrary stuck-at faults at outputs of gates
• SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES
• Shannon function of the test length with respect to gate input identification
• Implementation of Linear Boolean Functions by Self-Correcting Circuits of Unreliable Logic Gates

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