Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases
DOI10.1515/DMA-2022-0001zbMATH Open1492.94228OpenAlexW4213350236MaRDI QIDQ2136299FDOQ2136299
IΔΎya G. Lyubich, Dmitry S. Romanov
Publication date: 10 May 2022
Published in: Discrete Mathematics and Applications (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1515/dma-2022-0001
Shannon functionBoolean circuiteasily testable circuitsingle diagnostic testinversion fault at gate output
Switching theory, applications of Boolean algebras to circuits and networks (94C11) Fault detection; testing in circuits and networks (94C12)
Cites Work
- Title not available (Why is that?)
- Single fault diagnostic tests for inversion faults of circuit elements over some bases
- Title not available (Why is that?)
- Complete diagnostic length 2 tests for logic networks under inverse faults of logic gates
- Synthesis of circuits admitting complete checking tests of constant length under inverse faults at outputs of elements
Cited In (4)
- Short single tests for circuits with arbitrary stuck-at faults at outputs of gates
- SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES
- Shannon function of the test length with respect to gate input identification
- Implementation of Linear Boolean Functions by Self-Correcting Circuits of Unreliable Logic Gates
Recommendations
- Single fault diagnostic tests for inversion faults of circuit elements over some bases π π
- Short single fault detection tests for logic networks under arbitrary faults of gates π π
- Short complete diagnostic tests for logic circuits in one infinite basis π π
- ON LOGIC NETWORKS ALLOWING SHORT SINGLE FAULT DETECTION TESTS UNDER ARBITRARY FAULTS OF GATES π π
- Complete diagnostic length 2 tests for logic networks under inverse faults of logic gates π π
- SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES π π
- About unitary diagnostic tests for constant faults of the same type at the outputs of functional gates π π
- Short single tests for circuits with arbitrary stuck-at faults at outputs of gates π π
- Construction of tests for finding multiple faults in combinational devices in arbitrary bases π π
- On tests detecting certain faults of circuit inputs for almost all Boolean functions π π
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