scientific article; zbMATH DE number 4172919
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Publication:3197775
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Cited in
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- A generalization of Shannon function
- Lower bounds for the lengths of single tests for Boolean circuits
- A method of synthesis of irredundant circuits admitting single fault detection tests of constant length
- Reliability of nonbranching programs in an arbitrary complete finite basis
- The length of single fault detection tests with respect to substitution of gates with inverters
- Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases
- About the reliability of circuits in the complete finite basis containing an essential linear function
- About reliability of circuits with faults of type 0 at the outputs of elements in a full finite basis containing a special function
- The generalized complexity of linear Boolean functions
- Short single tests for circuits with arbitrary stuck-at faults at outputs of gates
- Synthesis of circuits admitting complete checking tests of constant length under inverse faults at outputs of elements
- Unit checking output tests under constant faults for functional elements
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- On checking tests for a parity counter
- Short Complete Fault Detection Tests for Logic Networks with Fan-In Two
- SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES
- Identity checking tests for circuits of functional elements in fan-in 2 bases
- On the exact value of the length of the minimal single diagnostic test for a particular class of circuits
- Statistical estimation of the structure of a finite population
- An upper bound of unreliability of non-branching programs in an arbitrary complete finite basis for one-type constant faults at the outputs of computational operators
- Complete checking of programmable logic arrays. I
- The length of a single fault detection test for constant-nonpreserving element insertions
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