Single fault detection tests for circuits of functional elements
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Recommendations
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- scientific article; zbMATH DE number 808813
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- Functional diagnosis of combinational circuits by compact testing methods
Cites work
Cited in
(27)- On Closedness and Test Complexity of Logic Circuits
- Unit checking output tests under constant faults for functional elements
- The length of a single fault detection test for constant-nonpreserving element insertions
- Path testing in circuits with functional units
- scientific article; zbMATH DE number 808802 (Why is no real title available?)
- A method of synthesis of irredundant circuits admitting single fault detection tests of constant length
- Identity checking tests for circuits of functional elements in fan-in 2 bases
- Short single tests for circuits with arbitrary stuck-at faults at outputs of gates
- Short single fault detection tests for logic networks under arbitrary faults of gates
- scientific article; zbMATH DE number 808813 (Why is no real title available?)
- SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES
- Method of synthesis of easily testable circuits admitting single fault detection tests of constant length
- Easily testable realization of a circuit on the basis of polynomial representation of output functions
- Functional diagnosis of combinational circuits by compact testing methods
- On tests detecting certain faults of circuit inputs for almost all Boolean functions
- Single fault detection tests for generalized iterative switching circuits
- Short tests of closures for contact circuits
- Multiple Stuck-Fault Detection and Location in Multivalued Linear Circuits
- Circuits over monoids: A fault model, and a trade-off between testability and circuit delay
- Synthesis of circuits admitting complete checking tests of constant length under inverse faults at outputs of elements
- scientific article; zbMATH DE number 4172919 (Why is no real title available?)
- Detection of faults in combinational circuits by a self-dual test
- The Complexity of Fault Detection Problems for Combinational Logic Circuits
- Minimal complete fault detection tests for circuits of functional elements in standard basis
- The length of single fault detection tests with respect to substitution of gates with inverters
- Single fault diagnostic tests for inversion faults of circuit elements over some bases
- The length of single-fault detection tests with respect to substitution of inverters for combinational elements in some bases
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