Single fault detection tests for circuits of functional elements

DOI10.3103/S0027132213040049zbMATH Open1298.94167MaRDI QIDQ469094FDOQ469094

Authors: S. S. Kolyada 

Publication date: 10 November 2014

Published in: Moscow University Mathematics Bulletin (Search for Journal in Brave)

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Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

Cites Work

• Easily Testable Realizations ror Logic Functions
• A method for synthesis of easily-testable circuits in some basis admitting single fault detection tests of constant length
• Unit checking output tests under constant faults for functional elements

Cited In (27)

• On Closedness and Test Complexity of Logic Circuits
• Unit checking output tests under constant faults for functional elements
• The length of a single fault detection test for constant-nonpreserving element insertions
• Path testing in circuits with functional units
• Title not available (Why is that?)
• A method of synthesis of irredundant circuits admitting single fault detection tests of constant length
• Identity checking tests for circuits of functional elements in fan-in 2 bases
• Short single tests for circuits with arbitrary stuck-at faults at outputs of gates
• Short single fault detection tests for logic networks under arbitrary faults of gates
• Title not available (Why is that?)
• SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES
• Method of synthesis of easily testable circuits admitting single fault detection tests of constant length
• Easily testable realization of a circuit on the basis of polynomial representation of output functions
• On tests detecting certain faults of circuit inputs for almost all Boolean functions
• Functional diagnosis of combinational circuits by compact testing methods
• Single fault detection tests for generalized iterative switching circuits
• Short tests of closures for contact circuits
• Multiple Stuck-Fault Detection and Location in Multivalued Linear Circuits
• Synthesis of circuits admitting complete checking tests of constant length under inverse faults at outputs of elements
• Circuits over monoids: A fault model, and a trade-off between testability and circuit delay
• Title not available (Why is that?)
• Detection of faults in combinational circuits by a self-dual test
• The Complexity of Fault Detection Problems for Combinational Logic Circuits
• Minimal complete fault detection tests for circuits of functional elements in standard basis
• The length of single fault detection tests with respect to substitution of gates with inverters
• Single fault diagnostic tests for inversion faults of circuit elements over some bases
• The length of single-fault detection tests with respect to substitution of inverters for combinational elements in some bases

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