Short tests of closures for contact circuits
From MaRDI portal
Publication:2192016
DOI10.1134/S0001434620030323zbMATH Open1448.94304OpenAlexW3020122799MaRDI QIDQ2192016FDOQ2192016
Authors: Kirill A. Popkov
Publication date: 26 June 2020
Published in: Mathematical Notes (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1134/s0001434620030323
Recommendations
- Tests of contact closure for contact circuits
- Correcting closures in contact circuits
- scientific article; zbMATH DE number 3284789
- Single test for closed contacts in block circuits
- scientific article; zbMATH DE number 3924684
- Bounds on Shannon functions of lengths of contact closure tests for contact circuits
- Diagnostic tests for contact circuits
- On fault detection tests of contact break for contact circuits
- On diagnostic tests of contact break for contact circuits
- On complete tests for contact circuits without quasi-repetitions
Switching theory, applications of Boolean algebras to circuits and networks (94C11) Boolean functions (94D10)
Cites Work
- Diagnostic tests for contact circuits
- Tests of contact closure for contact circuits
- Title not available (Why is that?)
- Title not available (Why is that?)
- Title not available (Why is that?)
- Title not available (Why is that?)
- Title not available (Why is that?)
- Title not available (Why is that?)
- Title not available (Why is that?)
- Single fault detection tests for circuits of functional elements
- On fault detection tests of contact break for contact circuits
Cited In (9)
- Short complete diagnostic tests for circuits implementing linear Boolean functions
- On implementation of Boolean functions by contact circuits with a constant uniform width
- Single test for closed contacts in block circuits
- Single tests for connected faults of contact networks
- Relative test elements for tight closure
- Title not available (Why is that?)
- Bounds on Shannon functions of lengths of contact closure tests for contact circuits
- Short fault detection tests for contact circuits under arbitrary weakly connected faults of contacts
- Title not available (Why is that?)
This page was built for publication: Short tests of closures for contact circuits
Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q2192016)