Short tests of closures for contact circuits
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Publication:2192016
Recommendations
- Tests of contact closure for contact circuits
- Correcting closures in contact circuits
- scientific article; zbMATH DE number 3284789
- Single test for closed contacts in block circuits
- scientific article; zbMATH DE number 3924684
- Bounds on Shannon functions of lengths of contact closure tests for contact circuits
- Diagnostic tests for contact circuits
- On fault detection tests of contact break for contact circuits
- On diagnostic tests of contact break for contact circuits
- On complete tests for contact circuits without quasi-repetitions
Cites work
- scientific article; zbMATH DE number 3150822 (Why is no real title available?)
- scientific article; zbMATH DE number 3877090 (Why is no real title available?)
- scientific article; zbMATH DE number 4139472 (Why is no real title available?)
- scientific article; zbMATH DE number 3924684 (Why is no real title available?)
- scientific article; zbMATH DE number 4085569 (Why is no real title available?)
- scientific article; zbMATH DE number 3422269 (Why is no real title available?)
- Diagnostic tests for contact circuits
- On fault detection tests of contact break for contact circuits
- Reliability and diagnostics of circuits
- Single fault detection tests for circuits of functional elements
- Tests of contact closure for contact circuits
Cited in
(14)- scientific article; zbMATH DE number 3924684 (Why is no real title available?)
- Bounds on Shannon functions of lengths of contact closure tests for contact circuits
- Short complete diagnostic tests for circuits implementing linear Boolean functions
- Diagnostic tests for contact circuits
- Tests of contact closure for contact circuits
- Short fault detection tests for contact circuits under arbitrary weakly connected faults of contacts
- On diagnostic tests of contact break for contact circuits
- The diagnosis of states of contacts
- On fault detection tests of contact break for contact circuits
- Single test for closed contacts in block circuits
- scientific article; zbMATH DE number 2032378 (Why is no real title available?)
- Single tests for connected faults of contact networks
- On implementation of Boolean functions by contact circuits with a constant uniform width
- Relative test elements for tight closure
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