Short tests of closures for contact circuits
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Publication:2192016
DOI10.1134/S0001434620030323zbMATH Open1448.94304OpenAlexW3020122799MaRDI QIDQ2192016FDOQ2192016
Publication date: 26 June 2020
Published in: Mathematical Notes (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1134/s0001434620030323
Switching theory, applications of Boolean algebras to circuits and networks (94C11) Boolean functions (94D10)
Cites Work
- Diagnostic tests for contact circuits
- Tests of contact closure for contact circuits
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- Single fault detection tests for circuits of functional elements
- On fault detection tests of contact break for contact circuits
Cited In (7)
- Short complete diagnostic tests for circuits implementing linear Boolean functions
- On implementation of Boolean functions by contact circuits with a constant uniform width
- Single tests for connected faults of contact networks
- Relative test elements for tight closure
- Bounds on Shannon functions of lengths of contact closure tests for contact circuits
- Short fault detection tests for contact circuits under arbitrary weakly connected faults of contacts
- Title not available (Why is that?)
Recommendations
- Tests of contact closure for contact circuits π π
- Correcting closures in contact circuits π π
- Title not available (Why is that?) π π
- Single test for closed contacts in block circuits π π
- Title not available (Why is that?) π π
- Bounds on Shannon functions of lengths of contact closure tests for contact circuits π π
- Diagnostic tests for contact circuits π π
- On fault detection tests of contact break for contact circuits π π
- On diagnostic tests of contact break for contact circuits π π
- On complete tests for contact circuits without quasi-repetitions π π
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