Tests of contact closure for contact circuits
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Publication:341824
DOI10.1515/DMA-2016-0025zbMATH Open1402.94131OpenAlexW3122043196MaRDI QIDQ341824FDOQ341824
Authors: Kirill A. Popkov
Publication date: 17 November 2016
Published in: Discrete Mathematics and Applications (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1515/dma-2016-0025
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Cited In (11)
- Single tests for contacts
- Single test for closed contacts in block circuits
- Single tests for connected faults of contact networks
- Relative test elements for tight closure
- Depth of a conditional full diagnostic test for contact circuits implementing a parity counter
- Properties of multiple faults in logic circuits with contacts
- Bounds on Shannon functions of lengths of contact closure tests for contact circuits
- Short tests of closures for contact circuits
- On diagnostic tests of contact break for contact circuits
- Short Complete Fault Detection Tests for Logic Networks with Fan-In Two
- On fault detection tests of contact break for contact circuits
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