Tests of contact closure for contact circuits

DOI10.1515/DMA-2016-0025zbMATH Open1402.94131OpenAlexW3122043196MaRDI QIDQ341824FDOQ341824

Authors Kirill A. Popkov

Publication date 17 November 2016

Published in Discrete Mathematics and Applications (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1515/dma-2016-0025

zbMATH Keywords

diagnostic testfault detection testcontact circuitcontact closure

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

Recommendations

• Short tests of closures for contact circuits
• On fault detection tests of contact break for contact circuits
• On diagnostic tests of contact break for contact circuits
• Bounds on Shannon functions of lengths of contact closure tests for contact circuits
• Diagnostic tests for contact circuits

Cites work

• scientific article; zbMATH DE number 3150822 (Why is no real title available?)
• scientific article; zbMATH DE number 3877090 (Why is no real title available?)
• scientific article; zbMATH DE number 4139472 (Why is no real title available?)
• scientific article; zbMATH DE number 3924684 (Why is no real title available?)
• scientific article; zbMATH DE number 4085569 (Why is no real title available?)
• scientific article; zbMATH DE number 3504828 (Why is no real title available?)
• scientific article; zbMATH DE number 3422269 (Why is no real title available?)
• Reliability and diagnostics of circuits

Cited in

(15)

• Bounds on Shannon functions of lengths of contact closure tests for contact circuits
• Diagnostic tests for contact circuits
• Depth of a conditional full diagnostic test for contact circuits implementing a parity counter
• Short fault detection tests for contact circuits under arbitrary weakly connected faults of contacts
• scientific article; zbMATH DE number 1194179 (Why is no real title available?)
• Short tests of closures for contact circuits
• On diagnostic tests of contact break for contact circuits
• The diagnosis of states of contacts
• On fault detection tests of contact break for contact circuits
• Single test for closed contacts in block circuits
• Short Complete Fault Detection Tests for Logic Networks with Fan-In Two
• Properties of multiple faults in logic circuits with contacts
• Single tests for contacts
• Single tests for connected faults of contact networks
• Relative test elements for tight closure

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