Minimal complete fault detection tests for circuits of functional elements in standard basis

DOI10.3103/S0027132219040077zbMATH Open1456.94140OpenAlexW2970098602MaRDI QIDQ2287393FDOQ2287393

Authors: Kirill A. Popkov 

Publication date: 20 January 2020

Published in: Moscow University Mathematics Bulletin (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.3103/s0027132219040077

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Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

Cites Work

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• Synthesis of easily-tested circuits in the case of single-type constant malfunctions at the element outputs

Cited In (9)

• On Closedness and Test Complexity of Logic Circuits
• Title not available (Why is that?)
• On minimal tests for schemes realizing disjunction
• Short complete diagnostic tests for logic circuits in one infinite basis
• Single fault detection tests for circuits of functional elements
• Functional diagnosis of combinational circuits by compact testing methods
• Title not available (Why is that?)
• Minimal length test vectors for multiple-fault detection
• Short Complete Fault Detection Tests for Logic Networks with Fan-In Two

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