Minimal complete fault detection tests for circuits of functional elements in standard basis
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Publication:2287393
Recommendations
- Complete fault detection tests of length 2 for logic networks under stuck-at faults of gates
- Short Complete Fault Detection Tests for Logic Networks with Fan-In Two
- Single fault detection tests for circuits of functional elements
- On the length of diagnostic tests for Boolean circuits
- Short complete diagnostic tests for logic circuits in one infinite basis
Cites work
- scientific article; zbMATH DE number 4139472 (Why is no real title available?)
- scientific article; zbMATH DE number 4085569 (Why is no real title available?)
- Reliability and diagnostics of circuits
- Synthesis of easily-tested circuits in the case of single-type constant malfunctions at the element outputs
Cited in
(13)- On minimal tests for schemes realizing disjunction
- Complete fault detection tests of length 2 for logic networks under stuck-at faults of gates
- Single fault detection tests for circuits of functional elements
- Functional diagnosis of combinational circuits by compact testing methods
- On Closedness and Test Complexity of Logic Circuits
- scientific article; zbMATH DE number 4018943 (Why is no real title available?)
- Short Complete Fault Detection Tests for Logic Networks with Fan-In Two
- Lower estimate of the length of the complete test in the basis \(\{x|y \}\)
- Minimal length test vectors for multiple-fault detection
- Short complete diagnostic tests for logic circuits in one infinite basis
- Identity checking tests for circuits of functional elements in fan-in 2 bases
- scientific article; zbMATH DE number 3877089 (Why is no real title available?)
- Lower bounds for the lengths of single tests for Boolean circuits
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