Functional diagnosis of combinational circuits by compact testing methods
From MaRDI portal
(Redirected from Publication:751633)
Recommendations
- Synthesizing testable combinational circuits
- Short complete diagnostic tests for circuits implementing linear Boolean functions
- Design of easily testable combinational circuits
- scientific article; zbMATH DE number 2211802
- Detection of faults in combinational circuits by a self-dual test
- Minimal complete fault detection tests for circuits of functional elements in standard basis
- Single fault detection tests for circuits of functional elements
- scientific article; zbMATH DE number 3922347
Cited in
(12)- Single fault detection tests for circuits of functional elements
- Short complete diagnostic tests for circuits implementing linear Boolean functions
- scientific article; zbMATH DE number 2081052 (Why is no real title available?)
- Converging search for a solution of technical diagnosis problems in digital circuits
- scientific article; zbMATH DE number 3961509 (Why is no real title available?)
- Design of easily testable combinational circuits
- A Hierarchical, Path-Oriented Approach to Fault Diagnosis in Modular Combinational Circuits
- A bound on information cost of circuit diagnosing tests
- Path testing in circuits with functional units
- Testing diagnostics of modern microprocessors with the use of functional models
- An algebraic diagnostic method for symmetric function circuitry
- scientific article; zbMATH DE number 4010401 (Why is no real title available?)
This page was built for publication: Functional diagnosis of combinational circuits by compact testing methods
Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q751633)
