Implementation of Linear Boolean Functions by Self-Correcting Circuits of Unreliable Logic Gates

DOI10.1134/S0001434624010073MaRDI QIDQ6494792zbMATH OpenFDO

Authors Kirill A. Popkov

Publication date 30 April 2024

Published in Mathematical Notes (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1134/S0001434624010073

Mathematics Subject Classification ID

Theory of computing (68Qxx) Circuits, networks (94Cxx) Miscellaneous topics in information and communication theory (94Dxx)

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Cites work

• scientific article; zbMATH DE number 4176986 (Why is no real title available?)
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• Easily testable circuits in Zhegalkin basis in the case of constant faults of type ``1 at gate outputs
• On asymptotically minimal self-correcting schemes for a sequence of Boolean functions
• On self-correcting logic circuits of unreliable gates
• On self-correcting logic circuits of unreliable gates with at most two inputs
• On the length of diagnostic tests for Boolean circuits
• On the synthesis of self-correcting schemes from functional elements with a small number of reliable elements
• Reliability and diagnostics of circuits
• Self-correcting schemes for functions of polynomial weight
• Short complete diagnostic tests for circuits implementing linear Boolean functions
• Short complete diagnostic tests for circuits with two additional inputs in some basis
• Short single fault detection tests for logic networks under arbitrary faults of gates
• Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases
• Some classes of easily testable circuits in the Zhegalkin basis

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