Implementation of Linear Boolean Functions by Self-Correcting Circuits of Unreliable Logic Gates
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Publication:6494792
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- Easily testable circuits in Zhegalkin basis in the case of constant faults of type ``1 at gate outputs
- On asymptotically minimal self-correcting schemes for a sequence of Boolean functions
- On self-correcting logic circuits of unreliable gates
- On self-correcting logic circuits of unreliable gates with at most two inputs
- On the length of diagnostic tests for Boolean circuits
- On the synthesis of self-correcting schemes from functional elements with a small number of reliable elements
- Reliability and diagnostics of circuits
- Self-correcting schemes for functions of polynomial weight
- Short complete diagnostic tests for circuits implementing linear Boolean functions
- Short complete diagnostic tests for circuits with two additional inputs in some basis
- Short single fault detection tests for logic networks under arbitrary faults of gates
- Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases
- Some classes of easily testable circuits in the Zhegalkin basis
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