Reliability and diagnostics of circuits
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Cited in
(64)- On fault detection tests of contact break for contact circuits
- Lower bounds for the lengths of single tests for Boolean circuits
- A method of synthesis of irredundant circuits admitting single fault detection tests of constant length
- Complete diagnostic length 2 tests for logic networks under inverse faults of logic gates
- Circuit representation for design and diagnosis of electronic systems
- Synthesis of reliable circuits in the basis consisting of the Webb function in P₄ and P₅
- The conjunction complexity asymptotic of self-correcting circuits for monotone symmetric functions with threshold 2
- Minimal contact circuits for a sequence of Boolean functions
- Bounds on Shannon functions of lengths of contact closure tests for contact circuits
- The length of single fault detection tests with respect to substitution of gates with inverters
- On self-correcting logic circuits of unreliable gates with at most two inputs
- The length of single-fault detection tests with respect to substitution of inverters for combinational elements in some bases
- Short tests of closures for contact circuits
- Minimal contact circuits for symmetric threshold functions
- On implementation of Boolean functions by contact circuits with a constant uniform width
- Synthesis of reliable circuits in the basis consisting of the Webb function in \(P_k\)
- Minimal complete fault detection tests for circuits of functional elements in standard basis
- Diagnostic tests for contact circuits
- Short single tests for circuits with arbitrary stuck-at faults at outputs of gates
- Upper bound of unreliability of circuits in a basis consisting of Webb functions
- Check and diagnostic tests for AND, OR, and NOT gates
- Synthesis of circuits admitting complete checking tests of constant length under inverse faults at outputs of elements
- On tests detecting certain faults of circuit inputs for almost all Boolean functions
- Computation of contact-circuit reliability
- Unit checking output tests under constant faults for functional elements
- Tests for multiple linear conglutinations of variables in Boolean functions
- On implementation of Boolean functions by contact circuits of minimal uniform width
- Short complete diagnostic tests for logic circuits in one infinite basis
- Some classes of easily testable circuits in the Zhegalkin basis
- Short complete diagnostic tests for circuits implementing linear Boolean functions
- Estimations of the lengths of tests for logic gates in presence of many permissible faults
- Tests of contact closure for contact circuits
- Complete fault detection tests of length 2 for logic networks under stuck-at faults of gates
- scientific article; zbMATH DE number 872143 (Why is no real title available?)
- Short Complete Fault Detection Tests for Logic Networks with Fan-In Two
- Short single fault detection tests for logic networks under arbitrary faults of gates
- Short complete diagnostic tests for circuits with one additional input in the standard basis
- Lower bounds for lengths of complete diagnostic tests for circuits and inputs of circuits
- SINGLE FAULT DETECTION TESTS FOR LOGIC NETWORKS OF AND, NOT GATES
- Synthesis of easily testable logic networks under arbitrary stuck-at faults at inputs and outputs of gates
- ABOUT RELIABILITY OF CIRCUITS IN THE BASIS CONSISTING OF THE WEBB FUNCTION IN Pk UNDER FAILURES OF 0 TYPE AND k − 1 TYPE AT THE OUTPUTS OF ELEMENTS
- A method for constructing logic networks allowing short single diagnostic tests
- On the exact value of the length of the minimal single diagnostic test for a particular class of circuits
- Short complete diagnostic tests for circuits with two additional inputs in some basis
- On test sets concerning local stuck-at faults of fixed multiplicity at the inputs of circuits
- Shannon function of the test length with respect to gate input identification
- Implementation of Linear Boolean Functions by Self-Correcting Circuits of Unreliable Logic Gates
- Short fault detection tests for contact circuits under arbitrary weakly connected faults of contacts
- Short conditional complete diagnostic tests for circuits under one-type constant faults of gates
- On diagnostic test sets for local mirror reflections on circuit inputs
- On the length of diagnostic tests for Boolean circuits
- Estimates of test lengths in the Zhegalkin basis for constant type-1 faults at gate outputs
- Single fault detection test sets with respect to stuck-at faults at the outputs of gates in formulas over one basis of Zhegalkin type
- Short single-fault tests for circuits in the Zhegalkin basis with arbitrary stuck-at faults of gates
- Short tests for contact circuits with similar-type weakly connected faults of contacts
- Easy-to-test circuits in the Zhegalkin basis with arbitrary stuck-at faults of gate outputs
- Short single fault detection tests of contact break for contact circuits with two or more additional poles
- Short fault detection tests of contact break for contact circuits with an additional pole
- On diagnostic tests of contact break for contact circuits
- Easily testable circuits in Zhegalkin basis in the case of constant faults of type ``1 at gate outputs
- The length of a single fault detection test for constant-nonpreserving element insertions
- Single fault detection tests for generalized iterative switching circuits
- Tests for multiple monotone symmetric conglutinations of variables in Boolean functions
- Lower estimate of the length of the complete test in the basis \(\{x|y \}\)
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