scientific article; zbMATH DE number 872143

MaRDI QIDQ4875345zbMATH OpenFDO

Authors Eugene R. Hnatek

Publication date 29 April 1996

zbMATH Keywords

contaminationfabrication techniquesindustrial perspectiveintegrated circuitsmanufacturing processesmaterials issuespackaging technologyquality engineeringreliabilitytesting

Mathematics Subject Classification ID

Research exposition (monographs, survey articles) pertaining to computer science (68-02) Reliability, testing and fault tolerance of networks and computer systems (68M15) Computer science aspects of computer-aided design (68U07) Research exposition (monographs, survey articles) pertaining to information and communication theory (94-02) Fault detection; testing in circuits and networks (94C12)

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(3)

• Integrated circuit techniques
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• Application and Reliability of Change-Point Analyses for Detecting a Defective Stage in Integrated Circuit Manufacturing

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