scientific article; zbMATH DE number 872143

MaRDI QIDQ4875345zbMATH OpenFDO

Authors Eugene R. Hnatek

Publication date 29 April 1996

zbMATH Keywords

reliabilitytestingcontaminationintegrated circuitsmanufacturing processesquality engineeringfabrication techniquesindustrial perspectivematerials issuespackaging technology

Mathematics Subject Classification ID

Research exposition (monographs, survey articles) pertaining to computer science (68-02) Research exposition (monographs, survey articles) pertaining to information and communication theory (94-02) Computer science aspects of computer-aided design (68U07) Reliability, testing and fault tolerance of networks and computer systems (68M15) Fault detection; testing in circuits and networks (94C12)

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Cited in

(2)

• Application and Reliability of Change-Point Analyses for Detecting a Defective Stage in Integrated Circuit Manufacturing
• Integrated circuit techniques

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