scientific article; zbMATH DE number 872143

zbMATH Open0849.94030MaRDI QIDQ4875345FDOQ4875345

Authors: Eugene R. Hnatek 

Publication date: 29 April 1996

Title of this publication is not available (Why is that?)

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zbMATH Keywords

reliabilitytestingcontaminationintegrated circuitsmanufacturing processesquality engineeringfabrication techniquesindustrial perspectivematerials issuespackaging technology

Mathematics Subject Classification ID

Research exposition (monographs, survey articles) pertaining to computer science (68-02) Research exposition (monographs, survey articles) pertaining to information and communication theory (94-02) Computer science aspects of computer-aided design (68U07) Reliability, testing and fault tolerance of networks and computer systems (68M15) Fault detection; testing in circuits and networks (94C12)

Cited In (2)

• Application and Reliability of Change-Point Analyses for Detecting a Defective Stage in Integrated Circuit Manufacturing
• Integrated circuit techniques

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