Process variations and probabilistic integrated circuit design.

DOI10.1007/978-1-4419-6621-6MaRDI QIDQ4933605zbMATH OpenOpenAlexFDO

Authors

Publication date 14 October 2010

Full work available at URL https://doi.org/10.1007/978-1-4419-6621-6

zbMATH Keywords

electronic design automationmicroelectronic circuitsparameter variationsstatistical methods

Mathematics Subject Classification ID

Collections of articles of miscellaneous specific interest (00B15) Technical applications of optics and electromagnetic theory (78A55) Proceedings, conferences, collections, etc. pertaining to statistical mechanics (82-06) Statistical mechanics of semiconductors (82D37) Statistical mechanics of nanostructures and nanoparticles (82D80) Analytic circuit theory (94C05)

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