Stochastic Analysis of Deep-Submicrometer CMOS Process for Reliable Circuits Designs

DOI10.1109/TCSI.2010.2055291MaRDI QIDQ5010547zbMATH OpenOpenAlexFDO

Authors Amir Zjajo, Qin Tang, Michel Berkelaar, José Pineda de Gyvez, Nick P. van der Meijs, A. Di Bucchianico

Publication date 26 August 2021

Published in IEEE Transactions on Circuits and Systems I: Regular Papers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/tcsi.2010.2055291

Mathematics Subject Classification ID

Applications of stochastic analysis (to PDEs, etc.) (60H30) Software, source code, etc. for problems pertaining to statistics (62-04) Signal theory (characterization, reconstruction, filtering, etc.) (94A12) Analytic circuit theory (94C05)

Recommendations

• scientific article; zbMATH DE number 1046427
• Process variations and probabilistic integrated circuit design.
• Integrated deterministic and stochastic simulation of electronic circuits: Application to large signal-noise analysis
• Design and Analysis of Efficient Maximum/Minimum Circuits for Stochastic Computing
• Accurate and Efficient Estimation of Logic Circuits Reliability Bounds
• Two-dimensional stochastic model for interconnections in master slice integrated circuits
• Exact reliability analysis of combinational logic circuits

Cited in

(2)

• Numerical simulation of fractional-order dynamical systems in noisy environments
• scientific article; zbMATH DE number 1046427 (Why is no real title available?)

This page was built for publication: Stochastic Analysis of Deep-Submicrometer CMOS Process for Reliable Circuits Designs

Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q5010547)