From variability tolerance to approximate computing in parallel integrated architectures and accelerators
From MaRDI portal
Recommendations
- Design, analysis and test of logic circuits under uncertainty
- Functional design errors in digital circuits. Diagnosis correction and repair
- Process variations and probabilistic integrated circuit design.
- Post-silicon and runtime verification for modern processors
- scientific article; zbMATH DE number 2017831
This page was built for publication: From variability tolerance to approximate computing in parallel integrated architectures and accelerators
Report a bug (only for logged in users!)Click here to report a bug for this page (MaRDI item Q4557170)