A state-of-the-art current mirror-based reliable wide fan-in FinFET domino OR gate design

DOI10.1007/S00034-017-0571-0MaRDI QIDQ2003201zbMATH OpenOpenAlexFDO

Authors Vikas Mahor, Manisha Pattanaik

Publication date 16 July 2019

Published in Circuits, Systems, and Signal Processing (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1007/s00034-017-0571-0

zbMATH Keywords

domino logicnoise immunityprocess variationFinFET

Mathematics Subject Classification ID

Analytic circuit theory (94C05)

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• NBTI-aware transient fault rate analysis method for logic circuit based on probability voltage transfer characteristics

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