A state-of-the-art current mirror-based reliable wide fan-in FinFET domino OR gate design

DOI10.1007/S00034-017-0571-0zbMATH Open1426.94171OpenAlexW2612976133MaRDI QIDQ2003201FDOQ2003201

Authors: Vikas Mahor, Manisha Pattanaik 

Publication date: 16 July 2019

Published in: Circuits, Systems, and Signal Processing (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/s00034-017-0571-0

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zbMATH Keywords

domino logicnoise immunityprocess variationFinFET

Mathematics Subject Classification ID

Analytic circuit theory (94C05)

Cited In (1)

• NBTI-aware transient fault rate analysis method for logic circuit based on probability voltage transfer characteristics

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