Construction of tests for finding multiple faults in combinational devices in arbitrary bases

MaRDI QIDQ2563145zbMATH OpenFDO

Authors M. F. Karavai

Publication date 1973

Published in Automation and Remote Control (Search for Journal in Brave)

Full work available at URL http://mathnet.ru/eng/at/y1973/i4/p164

Mathematics Subject Classification ID

Fault detection; testing in circuits and networks (94C12)

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(16)

• Method for segregation of suspected logical malfunctions in combinatorial discrete devices
• Properties of multiple faults in logic circuits with contacts
• Diagnostics for combinational circuits and cyclic codes over extensions of finite fields
• Single diagnostic tests for inversion faults of gates in circuits over arbitrary bases
• Construction of the tests of combinational circuit failures by analyzing the orthogonal disjunctive normal forms represented by the alternative graphs
• Quick detection of faults in combinational networks designed in minterm format by computing a single novel parameter
• Models of the general theory of test construction of relatively constant malfunctions
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