Decoding the results of diagnosing experiments in an asynchronous device with memory

MaRDI QIDQ800316zbMATH OpenFDO

Authors A. Eh. Targamadze

Publication date 1984

Published in Automation and Remote Control (Search for Journal in Brave)

zbMATH Keywords

asynchronous device with memorydecodingdetection of multiple stuck-at faultsdiagnosing experiments

Mathematics Subject Classification ID

Formal languages and automata (68Q45)

Recommendations

• Delay fault diagnosis in sequential circuits based on path tracing
• Functional and test diagnosis of digital devices with memory
• Serial diagnostic fault simulation for synchronous sequential circuits
• Maximum ease of testability of logic circuits with respect to multiple stuck-on faults
• Construction of tests for finding multiple faults in combinational devices in arbitrary bases

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