Efficient VLSI fault simulation

DOI10.1016/0898-1221(93)90219-LzbMath0760.94020MaRDI QIDQ1203708

John H. Reif

Publication date: 22 February 1993

Published in: Computers \& Mathematics with Applications (Search for Journal in Brave)

zbMATH Keywords

VLSI circuits; fault simulation; test pattern; acyclic Boolean circuit

Mathematics Subject Classification ID

94C12: Fault detection; testing in circuits and networks

Related Items

Boolean derivatives on cellular automata

Cites Work

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