Efficiency of Random Compact Testing

DOI10.1109/TC.1978.1675142zbMATH Open0377.94041MaRDI QIDQ4156330FDOQ4156330

Authors: Jacques Losq 

Publication date: 1978

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Mathematics Subject Classification ID

Cited In (1)

• Efficient VLSI fault simulation

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