Efficient VLSI fault simulation (Q1203708)
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scientific article; zbMATH DE number 120316
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | No label defined |
||
| English | Efficient VLSI fault simulation |
scientific article; zbMATH DE number 120316 |
Statements
Efficient VLSI fault simulation (English)
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22 February 1993
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fault simulation
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acyclic Boolean circuit
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test pattern
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VLSI circuits
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0.7537744641304016
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0.7491397261619568
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0.7490846514701843
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0.7488903403282166
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0.7461097240447998
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