Exhaustive Generation of Bit Patterns with Applications to VLSI Self-Testing (Q3659697)
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scientific article; zbMATH DE number 3811482
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| English | Exhaustive Generation of Bit Patterns with Applications to VLSI Self-Testing |
scientific article; zbMATH DE number 3811482 |
Statements
Exhaustive Generation of Bit Patterns with Applications to VLSI Self-Testing (English)
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1983
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linear feedback shift registers
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primitive polynomials
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VLSI self-testing
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