Short single tests for circuits with arbitrary stuck-at faults at outputs of gates (Q2332897)

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Short single tests for circuits with arbitrary stuck-at faults at outputs of gates
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    Short single tests for circuits with arbitrary stuck-at faults at outputs of gates (English)
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    5 November 2019
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    circuit of gates
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    stuck-at fault
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    single fault detection test
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    single diagnostic test
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