Short single tests for circuits with arbitrary stuck-at faults at outputs of gates (Q2332897)
From MaRDI portal
| This is the item page for this Wikibase entity, intended for internal use and editing purposes. Please use this page instead for the normal view: Short single tests for circuits with arbitrary stuck-at faults at outputs of gates |
scientific article; zbMATH DE number 7126348
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | No label defined |
||
| English | Short single tests for circuits with arbitrary stuck-at faults at outputs of gates |
scientific article; zbMATH DE number 7126348 |
Statements
Short single tests for circuits with arbitrary stuck-at faults at outputs of gates (English)
0 references
5 November 2019
0 references
circuit of gates
0 references
stuck-at fault
0 references
single fault detection test
0 references
single diagnostic test
0 references
0 references
0 references
0 references
0 references
0 references
0 references
0.91668296
0 references
0 references
0.8941892
0 references
0.8933277
0 references
0.89077157
0 references
0.8770709
0 references
0.8742783
0 references
0.87145764
0 references
0.87144583
0 references