Short single tests for circuits with arbitrary stuck-at faults at outputs of gates (Q2332897)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Short single tests for circuits with arbitrary stuck-at faults at outputs of gates |
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Short single tests for circuits with arbitrary stuck-at faults at outputs of gates (English)
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5 November 2019
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circuit of gates
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stuck-at fault
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single fault detection test
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single diagnostic test
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