Lower bounds for the lengths of single tests for Boolean circuits (Q1741479)
From MaRDI portal
!
This is the item page for this Wikibase entity, intended for internal use and editing purposes. Please use the normal view instead:
scientific article; zbMATH DE number 7050888
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | No label defined |
||
| English | Lower bounds for the lengths of single tests for Boolean circuits |
scientific article; zbMATH DE number 7050888 |
Statements
Lower bounds for the lengths of single tests for Boolean circuits (English)
0 references
3 May 2019
0 references
Boolean circuit
0 references
stuck-at fault
0 references
single fault detection test
0 references
single diagnostic test
0 references
0 references
0 references
0 references
0 references
0 references
0 references
0.8824310302734375
0 references
0.8765202760696411
0 references
0.8616395592689514
0 references
0.8488305807113647
0 references
0.8463074564933777
0 references
