Pages that link to "Item:Q1741479"

The following pages link to Lower bounds for the lengths of single tests for Boolean circuits (Q1741479):

Displaying 4 items.

• The length of single fault detection tests with respect to substitution of gates with inverters (Q2096004) (← links)
• The length of single-fault detection tests with respect to substitution of inverters for combinational elements in some bases (Q2135320) (← links)
• Short single tests for circuits with arbitrary stuck-at faults at outputs of gates (Q2332897) (← links)
• A METHOD FOR CONSTRUCTING LOGIC NETWORKS ALLOWING SHORT SINGLE DIAGNOSTIC TESTS (Q5151288) (← links)