The length of single-fault detection tests with respect to substitution of inverters for combinational elements in some bases (Q2135320)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | The length of single-fault detection tests with respect to substitution of inverters for combinational elements in some bases |
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The length of single-fault detection tests with respect to substitution of inverters for combinational elements in some bases (English)
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6 May 2022
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combinational circuit
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combinational elements
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logic gates
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detection test
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Shannon function
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gate substitution
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