Logic Test Pattern Generation Using Linear Codes (Q3335684)
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scientific article; zbMATH DE number 3867229
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | No label defined |
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| English | Logic Test Pattern Generation Using Linear Codes |
scientific article; zbMATH DE number 3867229 |
Statements
Logic Test Pattern Generation Using Linear Codes (English)
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1984
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linear feedback shift-registers
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test pattern generation
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VLSI testing
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Logic testing
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integrated circuits
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exhaustive test patterns
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linear polynomial codes
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0.8291044235229492
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0.7718376517295837
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0.7494663000106812
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0.7431918382644653
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0.7390841245651245
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