Exhaustive test pattern generation using cyclic codes (Q3783972)
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scientific article; zbMATH DE number 4047612
| Language | Label | Description | Also known as |
|---|---|---|---|
| default for all languages | No label defined |
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| English | Exhaustive test pattern generation using cyclic codes |
scientific article; zbMATH DE number 4047612 |
Statements
Exhaustive test pattern generation using cyclic codes (English)
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1988
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linear codes
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VLSI
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linear feedback shift registers
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punctured cyclic codes
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0.8291044235229492
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0.7692857384681702
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0.7646012306213379
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0.7518590092658997
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0.74249267578125
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