Exhaustive test pattern generation using cyclic codes

DOI10.1109/12.2152MaRDI QIDQ3783972zbMATH OpenOpenAlexFDO

Authors

Publication date 1988

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/12.2152

zbMATH Keywords

linear codeslinear feedback shift registerspunctured cyclic codesVLSI

Mathematics Subject Classification ID

Cyclic codes (94B15)

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Cited in

(4)

• Verification Testing—A Pseudoexhaustive Test Technique
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• Synthesis of pseudorandom test pattern generators

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