Provably good pattern generators for a random pattern test
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Cites work
- scientific article; zbMATH DE number 3459745 (Why is no real title available?)
- scientific article; zbMATH DE number 3303654 (Why is no real title available?)
- scientific article; zbMATH DE number 3397423 (Why is no real title available?)
- Bonferroni inequalities
- Generalized Bonferroni inequalities
- How to Generate Cryptographically Strong Sequences of Pseudorandom Bits
- Methods for Proving Bonferroni Type Inequalities
- On the discrepancy of GFSR pseudorandom numbers
- On the power of two-point based sampling
- Provably good pattern generators for a random pattern test
- Universal classes of hash functions
Cited in
(26)- Producing reliable initialization and test of sequential circuits with pseudorandom vectors
- On the use of counters for reproducing deterministic test sets
- Realistic analysis of some randomized algorithms
- Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers
- An Algorithm to Generate Random Large Combinational Circuits
- Fault coverage and test length estimation for random pattern testing
- A multiple-sequence generator based on inverted nonlinear autonomous machines
- Arithmetic additive generators of pseudo-exhaustive test patterns
- On evaluating and optimizing weights for weighted random pattern testing
- Synthesis of pseudorandom test pattern generators
- Provably good pattern generators for a random pattern test
- Computational analysis of counter-based schemes for VLSI test pattern generation
- Test pattern generator for NMOS integrated circuits
- Functional test generation based on combined random and deterministic search methods
- scientific article; zbMATH DE number 4029454 (Why is no real title available?)
- On Random Pattern Test Length
- Logic Test Pattern Generation Using Linear Codes
- Pseudorandom test pattern generators for built-in self-testing: a power reduction method
- Deterministic alternatives to statistical tests in binary pattern generators
- BIST test pattern generators for two-pattern testing-theory and design algorithms
- A simple analysis of the error probability of two-point based sampling
- Antirandom test vectors for BIST in hardware/software systems
- scientific article; zbMATH DE number 176529 (Why is no real title available?)
- A combinatorial error bound for \(t\)-point-based sampling
- Exhaustive test pattern generation using cyclic codes
- scientific article; zbMATH DE number 4077134 (Why is no real title available?)
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