Provably good pattern generators for a random pattern test

DOI10.1007/BF01293265MaRDI QIDQ1322559zbMATH OpenOpenAlexFDO

Authors Thomas H. Spencer

Publication date 24 July 1994

Published in Algorithmica (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1007/bf01293265

zbMATH Keywords

combined circuitspseudorandom pattern generatorrandom pattern test

Mathematics Subject Classification ID

Random number generation in numerical analysis (65C10) Reliability, testing and fault tolerance of networks and computer systems (68M15) Fault detection; testing in circuits and networks (94C12) Hardware implementations of nonnumerical algorithms (VLSI algorithms, etc.) (68W35)

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Cites work

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• Bonferroni inequalities
• Generalized Bonferroni inequalities
• How to Generate Cryptographically Strong Sequences of Pseudorandom Bits
• Methods for Proving Bonferroni Type Inequalities
• On the discrepancy of GFSR pseudorandom numbers
• On the power of two-point based sampling
• Provably good pattern generators for a random pattern test
• Universal classes of hash functions

Cited in

(26)

• Producing reliable initialization and test of sequential circuits with pseudorandom vectors
• On the use of counters for reproducing deterministic test sets
• Realistic analysis of some randomized algorithms
• Built-in test for circuits with scan based on reseeding of multiple-polynomial linear feedback shift registers
• An Algorithm to Generate Random Large Combinational Circuits
• Fault coverage and test length estimation for random pattern testing
• A multiple-sequence generator based on inverted nonlinear autonomous machines
• Arithmetic additive generators of pseudo-exhaustive test patterns
• On evaluating and optimizing weights for weighted random pattern testing
• Synthesis of pseudorandom test pattern generators
• Provably good pattern generators for a random pattern test
• Computational analysis of counter-based schemes for VLSI test pattern generation
• Test pattern generator for NMOS integrated circuits
• Functional test generation based on combined random and deterministic search methods
• scientific article; zbMATH DE number 4029454 (Why is no real title available?)
• On Random Pattern Test Length
• Logic Test Pattern Generation Using Linear Codes
• Pseudorandom test pattern generators for built-in self-testing: a power reduction method
• Deterministic alternatives to statistical tests in binary pattern generators
• BIST test pattern generators for two-pattern testing-theory and design algorithms
• A simple analysis of the error probability of two-point based sampling
• Antirandom test vectors for BIST in hardware/software systems
• scientific article; zbMATH DE number 176529 (Why is no real title available?)
• A combinatorial error bound for \(t\)-point-based sampling
• Exhaustive test pattern generation using cyclic codes
• scientific article; zbMATH DE number 4077134 (Why is no real title available?)

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