scientific article; zbMATH DE number 4029454

zbMATH Open0632.94024MaRDI QIDQ3770451FDOQ3770451

Authors: Hans-Joachim Wunderlich 

Publication date: 1987

Title of this publication is not available (Why is that?)

Recommendations

• Choice of optimal multiparametric probability distributions of input variables for probabilistic testing of digital circuits
• scientific article; zbMATH DE number 176529
• Provably good pattern generators for a random pattern test
• Design of universal test sequences for VLSI
• On evaluating and optimizing weights for weighted random pattern testing

zbMATH Keywords

design for testabilityfault detection probabilityinput signal probability optimizationrandom test generationVLSI combinational circuits

Mathematics Subject Classification ID

Research exposition (monographs, survey articles) pertaining to information and communication theory (94-02) Combinatorial probability (60C05)

Cited In (11)

• Fault coverage and test length estimation for random pattern testing
• On evaluating and optimizing weights for weighted random pattern testing
• Test schedules for VLSI circuits having built-in test hardware
• Design of universal test sequences for VLSI
• On Random Pattern Test Length
• Title not available (Why is that?)
• Title not available (Why is that?)
• Bounding Signal Probabilities in Combinational Circuits
• Confidence intervals for expected coverage from a beta testability model
• Title not available (Why is that?)
• Producing reliable initialization and test of sequential circuits with pseudorandom vectors

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