scientific article; zbMATH DE number 4029454

MaRDI QIDQ3770451zbMATH OpenFDO

Authors Hans-Joachim Wunderlich

Publication date 1987

zbMATH Keywords

design for testabilityfault detection probabilityinput signal probability optimizationrandom test generationVLSI combinational circuits

Mathematics Subject Classification ID

Research exposition (monographs, survey articles) pertaining to information and communication theory (94-02) Combinatorial probability (60C05)

Recommendations

• Choice of optimal multiparametric probability distributions of input variables for probabilistic testing of digital circuits
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(11)

• Fault coverage and test length estimation for random pattern testing
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• Test schedules for VLSI circuits having built-in test hardware
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• On Random Pattern Test Length
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• Bounding Signal Probabilities in Combinational Circuits
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• Producing reliable initialization and test of sequential circuits with pseudorandom vectors

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