The Weighted Random Test-Pattern Generator

DOI10.1109/T-C.1975.224290zbMATH Open0324.94031OpenAlexW2123535960MaRDI QIDQ4088743FDOQ4088743

H. Daniel Schnurmann, Robert G. Carpenter, Eric Lindbloom

Publication date: 1975

Published in: IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/t-c.1975.224290

Mathematics Subject Classification ID

Cited In (1)

• Efficient VLSI fault simulation

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