The Weighted Random Test-Pattern Generator

DOI10.1109/T-C.1975.224290MaRDI QIDQ4088743zbMATH OpenOpenAlexFDO

Authors H. Daniel Schnurmann, Eric Lindbloom, Robert G. Carpenter

Publication date 1975

Published in IEEE Transactions on Computers (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/t-c.1975.224290

Mathematics Subject Classification ID

Cited in

(1)

• Efficient VLSI fault simulation

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