A uniform approach to mixed-signal circuit test (Q4367096): Difference between revisions

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+A uniform approach to mixed-signal circuit test
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+Q5617282
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+Normal rank
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+Multiple-fault location of analog circuits
@@ Property / cites work: Multiple-fault location of analog circuits / rank @@
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+Q4132373
@@ Property / cites work: Q4132373 / rank @@
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+Automatic test generation techniques for analog circuits and systems: A review
+Normal rank
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+On a theory of t-fault diagnosable analog systems
@@ Property / cites work: On a theory of t-fault diagnosable analog systems / rank @@
+Normal rank
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+Node-fault diagnosis and a design of testability
@@ Property / cites work: Node-fault diagnosis and a design of testability / rank @@
+Normal rank
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+Efficient fault analysis in linear analog circuits
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@@ Property / cites work @@
+A theory and an algorithm for analog circuit fault diagnosis
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+Diagnosability of linear active networks
@@ Property / cites work: Diagnosability of linear active networks / rank @@
+Normal rank
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+Fault diagnosis for linear systems via multifrequency measurements
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@@ Property / cites work @@
+Multiport approach to multiple-fault location in analog circuits
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@@ Property / cites work @@
+Calculation of parameter values from node voltage measurements
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+On observability of discrete-event systems
@@ Property / cites work: On observability of discrete-event systems / rank @@
+Normal rank
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+Observability of discrete event dynamic systems
@@ Property / cites work: Observability of discrete event dynamic systems / rank @@
+Normal rank
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+Supervisory control of discrete-event processes with partial observations
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+Supervisory Control of a Class of Discrete Event Processes
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+Diagnosability of discrete event systems and its applications
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@@ Property / full work available at URL @@
+https://doi.org/10.1002/(sici)1097-007x(199703/04)25:2<81::aid-cta952>3.0.co;2-p
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+W1972852622
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@@ Property / title @@
+A uniform approach to mixed-signal circuit test (English)
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