A uniform approach to mixed-signal circuit test
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Publication:4367096
DOI<link itemprop=identifier href="https://doi.org/10.1002/(SICI)1097-007X(199703/04)25:2<81::AID-CTA952>3.0.CO;2-P" /><81::AID-CTA952>3.0.CO;2-P 10.1002/(SICI)1097-007X(199703/04)25:2<81::AID-CTA952>3.0.CO;2-PzbMath0881.94030OpenAlexW1972852622MaRDI QIDQ4367096
T. William Lin, Feng Lin, Zhenghui Lin
Publication date: 11 February 1998
Full work available at URL: https://doi.org/10.1002/(sici)1097-007x(199703/04)25:2<81::aid-cta952>3.0.co;2-p
Fault detection; testing in circuits and networks (94C12) Reliability, testing and fault tolerance of networks and computer systems (68M15)
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Cites Work
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