Node-fault diagnosis and a design of testability
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Publication:3665001
DOI10.1109/TCS.1983.1085359zbMath0516.94029MaRDI QIDQ3665001
Chen-Shang Lin, Ruey-wen Liu, Zhengfeng Huang
Publication date: 1983
Published in: IEEE Transactions on Circuits and Systems (Search for Journal in Brave)
testabilitytest proceduredesign of testabilitygraph of the circuittopological condition for testability
Applications of design theory to circuits and networks (94C30) Applications of graph theory to circuits and networks (94C15)
Related Items (3)
A uniform approach to mixed-signal circuit test ⋮ Fault prediction for analog circuits ⋮ Fast algorithms for selection of test nodes of an analog circuits using a generalized fault dictionary approach
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