Fast algorithms for selection of test nodes of an analog circuits using a generalized fault dictionary approach
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Publication:1908843
DOI10.1007/BF01204680zbMath0842.94022MaRDI QIDQ1908843
S. N. Rao Pinjala, V. C. Prasad
Publication date: 7 March 1996
Published in: Circuits, Systems, and Signal Processing (Search for Journal in Brave)
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Cites Work
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