Simplified ATPG and analog fault location via a clustering and separability technique
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Publication:4198656
DOI10.1109/TCS.1979.1084664zbMATH Open0409.94047OpenAlexW2125125767MaRDI QIDQ4198656FDOQ4198656
Authors: K. C. Varghese, J. Hywel Williams, Denis R. Towill 
Publication date: 1979
Published in: IEEE Transactions on Circuits and Systems (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1109/tcs.1979.1084664
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- Fast algorithms for selection of test nodes of an analog circuits using a generalized fault dictionary approach
- A unified decomposition approach for fault location in large analog circuits
- Automatic test generation techniques for analog circuits and systems: A review
- Fault isolation algorithm for analog electronic systems using the fuzzy concept
- An ATPG Method for Double Stuck-At Faults by Analyzing Propagation Paths of Single Faults
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