DOI10.1109/TCS.1979.1084664zbMath0409.94047MaRDI QIDQ4198656
Denis R. Towill, K. C. Varghese, J. Hywel Williams
Publication date: 1979 Published in: IEEE Transactions on Circuits and Systems (Search for Journal in Brave)
zbMATH Keywords
clustering; separability; automatic test generation; linear network; analog fault location
Mathematics Subject Classification ID
94C12: Fault detection; testing in circuits and networks
62N05: Reliability and life testing
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