Simplified ATPG and analog fault location via a clustering and separability technique

DOI10.1109/TCS.1979.1084664MaRDI QIDQ4198656zbMATH OpenOpenAlexFDO

Authors K. C. Varghese, J. Hywel Williams, Denis R. Towill

Publication date 1979

Published in IEEE Transactions on Circuits and Systems (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/tcs.1979.1084664

zbMATH Keywords

clusteringseparabilityautomatic test generationlinear networkanalog fault location

Mathematics Subject Classification ID

Reliability and life testing (62N05) Fault detection; testing in circuits and networks (94C12)

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Cited in

(5)

• Fast algorithms for selection of test nodes of an analog circuits using a generalized fault dictionary approach
• A unified decomposition approach for fault location in large analog circuits
• Automatic test generation techniques for analog circuits and systems: A review
• Fault isolation algorithm for analog electronic systems using the fuzzy concept
• An ATPG Method for Double Stuck-At Faults by Analyzing Propagation Paths of Single Faults

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