Fast algorithms for selection of test nodes of an analog circuits using a generalized fault dictionary approach (Q1908843)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Fast algorithms for selection of test nodes of an analog circuits using a generalized fault dictionary approach |
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Fast algorithms for selection of test nodes of an analog circuits using a generalized fault dictionary approach (English)
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7 March 1996
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analog circuit
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test nodes
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fault dictionary approach
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