Fault prediction for analog circuits (Q1099776)

The main problems that are the major concern in network testing are fault detection, fault location, and fault prediction. In this paper a multiple-fault-prediction algorithm is proposed for analog circuits with inaccessible nodes. The components in the circuits may be nominals or may be deviated from the nominals within a prescribed tolerance. In the proposed prediction algorithm, the component values are evaluated according to the consecutive voltage measurements that are continuously monitored at the accessible test points at each periodic maintenance. The component values are used to locate the faulty components and/or to predict the components that are about to fail.