Fault prediction for analog circuits

DOI10.1007/BF01600009zbMath0638.90043OpenAlexW2017655909MaRDI QIDQ1099776

Ben-Lu Jiang, Chin-Long Wey, Li-Juan Fan

Publication date: 1988

Published in: Circuits, Systems, and Signal Processing (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1007/bf01600009

zbMATH Keywords

fault detectionanalog circuitsfault locationfault predictioninaccessible nodesmultiple-fault-prediction algorithmnetwork testing

Mathematics Subject Classification ID

Reliability, availability, maintenance, inspection in operations research (90B25) Deterministic network models in operations research (90B10)

Related Items (1)

Fast algorithms for selection of test nodes of an analog circuits using a generalized fault dictionary approach

Cites Work

• Node-fault diagnosis and a design of testability
• Multiple-fault location of analog circuits

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