Multiple-fault location of analog circuits
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Publication:3908979
DOI10.1109/TCS.1981.1084998zbMath0458.94078MaRDI QIDQ3908979
John W. Bandler, Radoslaw M. Biernacki
Publication date: 1981
Published in: IEEE Transactions on Circuits and Systems (Search for Journal in Brave)
Related Items (4)
A uniform approach to mixed-signal circuit test ⋮ Fault prediction for analog circuits ⋮ Fast algorithms for selection of test nodes of an analog circuits using a generalized fault dictionary approach ⋮ Fault diagnosis under a limited-fault assumption and limited test-point availability
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