Optimum fault isolation by statistical inference

DOI10.1109/TCS.1979.1084667zbMath0417.94029OpenAlexW2123031201MaRDI QIDQ3208578

Smith Freeman

Publication date: 1979

Published in: IEEE Transactions on Circuits and Systems (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/tcs.1979.1084667

zbMATH Keywords

statistical inferencefault isolationtest sequencingcatastrophic faults in analog electrical circuitsfault identification algorithm

Mathematics Subject Classification ID

Circuits, networks (94C99) Analytic circuit theory (94C05)

Related Items (1)

Fast algorithms for selection of test nodes of an analog circuits using a generalized fault dictionary approach

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